[IEEE]
Memory leaks represent a remarkable problem for mobile app developers since a waste of memory due to bad programming practices may reduce the available memory of the device, slow down the apps, reduce their responsiveness and, in the worst cases, they may cause the crash of the app. A common cause of memory leaks in the specific context of Android apps is the bad handling of the events tied to the Activity Lifecycle. In order to detect and characterize these memory leaks, we present FunesDroid, a tool-supported black box technique for the automatic detection of memory leaks tied to the Activity Lifecycle in Android apps. FunesDroid implements a testing approach that can find memory leaks by analyzing unnecessary heap object replications after the execution of three different sequences of Activity Lifecycle events. In the paper, we present an exploratory study that shows the capability of the proposed technique to detect memory leaks and to characterize them in terms of their size, persistence and growth trend. The study also illustrates how memory leak causes can be detected with the support of the information provided by the FunesDroid tool.